Bao, S. J., S. H. Li, Z. Y. Pan, F. X. Liang, and S. H. Han. “Fault Diagnosis of Drop-Out Fuses Based on Hidden Markov Model and Graph Embedding”. Advanced Electromagnetics 15, no. 3 (August 13, 2026): 5201–5211. Accessed September 6, 2026. https://www.aemjournal.org/index.php/AEM/article/view/3576.