LU, Y. K. Smartphone Battery Life Prediction and Sensitivity Analysis Integrating Electrothermal Coupling Dynamics and Stochastic Processes. Advanced Electromagnetics, [S. l.], v. 15, n. 3, p. 10996–11003, 2026. DOI: 10.7716/aem.v15i3.4310. Disponível em: https://www.aemjournal.org/index.php/AEM/article/view/4310. Acesso em: 15 sep. 2026.