BAO, S. J.; LI, S. H.; PAN, Z. Y.; LIANG, F. X.; HAN, S. H. Fault Diagnosis of Drop-Out Fuses Based on Hidden Markov Model and Graph Embedding. Advanced Electromagnetics, [S. l.], v. 15, n. 3, p. 5201–5211, 2026. DOI: 10.7716/aem.v15i3.3576. Disponível em: https://www.aemjournal.org/index.php/AEM/article/view/3576. Acesso em: 7 sep. 2026.