LI, Y. L.; WU, N.; QIU, Z. Y. Deep Learning-Driven Virtual Clothing Fit Detection and Automatic Pattern Correction Technology. Advanced Electromagnetics, [S. l.], v. 15, n. 3, p. 3464–3484, 2026. DOI: 10.7716/aem.v15i3.3412. Disponível em: https://www.aemjournal.org/index.php/AEM/article/view/3412. Acesso em: 15 aug. 2026.