LIU, T. Carrier Mobility Prediction and Device Stability Evaluation of Perovskite Optoelectronic Thin Films Using Small-Sample Deep Learning Algorithms. Advanced Electromagnetics, [S. l.], v. 15, n. 3, p. 684–692, 2026. DOI: 10.7716/aem.v15i3.3119. Disponível em: https://www.aemjournal.org/index.php/AEM/article/view/3119. Acesso em: 16 oct. 2026.