Reliability Study of Mechatronic Power Components Using Spectral Photon Emission Microscopy

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N. Moultif
E. Joubert
O. Latry


In this paper, we present one of the most important failure analysis tools that permits the localizing and the identification of the failure mechanisms. It is a new spectral photon emission system, enabling to localize the failure, and quickly get the photon emission spectra that characterize the failure with high resolution. A diffraction grating is used as a spectrometer in the system. Application results on mechatronic power devices such as HEMT AlGaN/GAN and SiC MOSFETs are reported.


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Moultif, N., Joubert, E., & Latry, O. (2016). Reliability Study of Mechatronic Power Components Using Spectral Photon Emission Microscopy. Advanced Electromagnetics, 5(3), 20–24.
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S. M. Kudva et al., The SEMATECH Failure Analysis Roadmap, Proc Int Symp Testing & Failure Analysis (ISTFA 1995), 6-10 Nov 95, Santa Clara, California, USA, pg 1-5, 1995.

I. De Wolf and M.S. Rasras. Spectroscopic photon emission microscopy: a unique tool for failure analysis of microelectronics devices. Microelectronics Reliability, 41(8):1161-1169, August 2001.

View Article

J. M. Tao et al. , Analysis And Quantification Of Device Spectral Signatures Observed Using A Spectroscopic Photon Emission Microscope, Proceedings of 6th IPFA '97, Singapore 1997.

View Article

J. C. H. Phang, D. S. H. Chan, et al. A review of near infrared photon emission microscopy and spectroscopy. In Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. Proceedings of the 12th International Symposium on the, pages 275-281. IEEE, June 2005.

View Article

J. Tao, P. Fang, and J. Wang. Backside IR photon emission microscopy (IR-PEM) observation in failure analysis of the packaged devices. In Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on, pages 1-4, IEEE, August 2007.

J. Kolzer, C. Boit, A. Dallmann, G. Deboy, J. Otto, D. Weinmann, "Quantitative Emission Microscopy", J Appl Phys, Vol 70, No 11, pg 23-41,1992.

View Article

Y. Y. Liu, J. M. Tao, D. S. H. Chan, J. C. H. Phang, and W. K. Chim. A new spectroscopic photon emission microscope system for semiconductor device analysis. In Physical and Failure Analysis of Integrated Circuits, 1995., Proceedings of the 1995 5th International Symposium on the, pages 60-65. IEEE, November 1995.

View Article

D. S. H. Chan, J. C. H. Phang, W. K. Chim, et al. Design and performance of a new spectroscopic photon emission microscope system for the physical analysis of semiconductor devices. Review of Scientific Instruments, 67(7):2576-2583, July 1996.

View Article

K. De Kort, P. Damink, H. Boots, Spectrum Emitted by Hot Electrons in p-i-n Cold Cathodes, Physical B, Vol 48, No 16,pg 11912-11920, 1993.

K. De Kort and P. Damink, The spectroscopic signature of light emitted by integrated circuits, Proceeding of the European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'90), p. 45, 1990.

M.S Rasras, I. De Wolf, G. Groeseneken, and H. E. Maes. Spectroscopic identication of light emitted from defects in silicon devices. Journal of Applied Physics, 89(1):249-258, January 2001.

View Article

S.C. Tan, K. Toh, J. Phang, D. Chan, et al. . A Near-Infrared, continuous wavelength, In-Lens spectroscopic photon emission microscope system. In Physical and Failure Analysis of Integrated Circuits, 2007. IPFA 2007. 14th International Symposium on the. IEEE, July 2007.

P. Scholz, A. Glowacki, U. Kerst, C. Boitet al. , Single image spectral electroluminescence (photon emission) of GaN HEMTs. In Reliability Physics Symposium (IRPS), 2013 IEEE International, pages CD.3.1-CD.3.7. IEEE, April 2013.

M. Armstrong, Investigation of deep level defects in GaN:C,GaN:Mg AND Pseudomorphic AlGaN/GaN Films; Thesis dissertation University of Ohio, 2006.

A. Armstrong, A. R. Arehart, Impact of carbon on trap states in n-type GaN grown by metalorganic chemical vapor deposition, App. Phy Vol 84, Num 3. 2004.

J. Casady, J. Palmour, High Megawatt Direct-Drive Motors and Front-End Power Electronics Workshop -Sept 2014, Panel: WBG Devices Cost and Development Roadmap: