Microwave microscopy applied to EMC problem: Visualisation of electromagnetic field in the vicinity of electronic circuit and effect of nanomaterial coating

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J. Rossignol
D. Stuerga
G. Bailly
A. Harrabi
S. Girard
S. Lalléchère


This proposal is devoted to a collaborative approach dealing with microwave microscopy experiments. The application is dedicated to an electromagnetic field cartography above circuits and the influence of nanometric material layer deposition on the circuits. The first application is associated to a microstrip ring resonator. The results match with the simulated fields. The second application is focused on the effects of a dielectric layer deposited on the circuit and its impact in terms of electromagnetic propagation.


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Rossignol, J., Stuerga, D., Bailly, G., Harrabi, A., Girard, S., & Lalléchère, S. (2017). Microwave microscopy applied to EMC problem: Visualisation of electromagnetic field in the vicinity of electronic circuit and effect of nanomaterial coating. Advanced Electromagnetics, 6(2), 33–39. https://doi.org/10.7716/aem.v6i2.429
Research Articles
Author Biography

S. Lalléchère, Université Blaise Pascal


Sébastien Lalléchère was born in Nevers (France) in 1979. He obtained his Master and PhD degrees respectively in computational modeling and electronics/electromagnetism from Polytech’Clermont (2002) and Université Blaise Pascal (UBP, 2006), both in Clermont-Ferrand, France. He served as research engineer in Institut Pascal (2007) granted by ANR program CISSSI focusing on intensive computational methods for electromagnetics. He joined Institut Pascal (IP) and Université Blaise Pascal (UBP), Clermont-Ferrand (France) as an Associate Professor in September 2007. His research interests cover the fields of electromagnetic compatibility (EMC) including antennas and propagation, complex and reverberating electromagnetic environments, computational electromagnetics, numerical stochastic modeling, reliability and sensitivity analysis in electrical engineering. He received funding grants for visiting appointments in 2006 and 2014 from French Foreign Affairs/Research Ministries and UBP for scientific stays respectively in ETH Zurich (Switzerland) and University of Split (Croatia). Dr. Lalléchère is an URSI corresponding member (Commission E "EM environment and interferences"), member of IEEE (EMC, MTT, AP societies), Applied Computational Electromagnetics Society (ACES) and of the French Electrical Engineering Society (SEE).


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